Professor Chason's research focuses on the evolution of thin films and surfaces, including the development of in situ diagnostics to monitor changes in stress and morphology as they occur. Recent studies involve residual stress during thin film growth, whisker formation in Sn coatings, and self-organized pattern formation during ion sputtering. This work includes experiments, computer simulation, and development of models to relate the experimental results to fundamental materials processes.
Eric Chason is a professor in the Division of Engineering at Brown University. He received his Ph.D. in physics from Harvard University in 1985, after which he performed post-doctoral work at Gakushuin University, Tokyo and was a staff member at Sandia National Laboratories in Albuquerque. His research has focused on the evolution of surfaces and thin films during materials processing. Part of this work has involved the development of real-time in situ thin film diagnostics for measuring film stress, morphology and microstructure. He has taught the course Introduction to Materials Science as well as graduate and undergraduate courses on kinetic processes in materials, crystallography, electronic materials and thin film materials. He is an active member of the American Physical Society and Materials Research Society.
On The Web:
Are you Eric Chason? Click here to edit your research profile.