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Jennifer Dworak's research focuses on the correctness and reliability of digital integrated circuits. Much of her work has involved the development of better test pattern generation techniques for improved identification of circuits containing manufacturing defects. She has done significant work on defect level modeling and is also currently investigating delay testing, design verification, and field failure rates due to undetected manufacturing defects or design errors.
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Jennifer Dworak joined Brown University as an Assistant Professor in January 2005. She graduated in May 2004 with a Ph.D. in Electrical Engineering at Texas A&M University under the supervision of Prof. M. Ray Mercer. Her research interests include digital circuit testing and automatic test pattern generation, defective part level modeling, logic minimization, and design verification. She graduated summa cum laude from Texas A&M University with a B.S.E.E. in December 1998 and graduated with her M.S.E.E. from Texas A&M University in May 2000. She received a National Science Foundation Graduate Fellowship and was co-author for a paper that won the Best Paper Award at the 1999 VLSI Test Symposium. She was also the winner of the Best Student Presentation Award at the 2002 International Test Synthesis Workshop.
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