Rudolph Technologies, Inc. (NASDAQ RTEC) is a world-wide leader in the design, development, manufacture and support of high-performance process control metrology and defect inspection equipment used by semiconductor device manufacturers. Rudolph provides a unique full-fab solution through its family of proprietary systems for thin-film measurements and macrodefect inspection. The company is headquartered in Flanders, NJ, and maintains an extensive global network of sales, service, and applications offices in Texas, Europe, Korea, Taiwan, Japan, Singapore, and China.

Rudolph has licensed technology from Brown University for measuring thin film thickness on semiconductors. This invention emerged from the laboratory of Brown Professor of Physics Humphrey Maris.

Additional information is available at http://www.rudolphtech.com.

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